Here, we enhance the capabilities of the atomic force microscope (AFM) to show that force profiles can be reconstructed without restriction by monitoring the wave profile of the cantilever during a single oscillation cycle. Two approaches are provided to reconstruct the force profile in both the steady and transient states in what we call single-cycle measurements. The robustness of the formalism is tested numerically to recover complex but relevant interactions. With single-cycle measurements, we add high temporal resolution (possibly microsecond range) to the spatial resolution of AFM. The access to simultaneous high throughput and high sensitivity further opens the door to a variety of feedback options for imaging