To access the full text documents, please follow this link: http://hdl.handle.net/2117/20287

Title:	Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: small amplitude small set-point imaging
Author:	Santos Hernández, Sergio; Barcons Xixons, Víctor; Christenson, Hugo K.; Billingsley, Daniel J.; Bonass, William A.; Font Teixidó, Josep; Thomson, Neil H.
Other authors:	Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics; Universitat Politècnica de Catalunya. CIRCUIT - Grup de Recerca en Circuits i Sistemes de Comunicació
Abstract:	A way to operate fundamental mode amplitude modulation atomic force microscopy is introduced which optimizes stability and resolution for a given tip size and shows negligible tip wear over extended time periods ( 24 h). In small amplitude smal l set-point (SASS) imaging, the cantilever oscillates with sub-nanometer am plitudes in the proximity of the sample, without the requirement of using large drive forces, a s the dynamics smoothly lead the tip to the surface through the water layer. SASS is demonstrat ed on single molecules of double-stranded DNA in ambient conditions where sharp silicon tips (R 2–5 nm) can resolve the right-handed double helix
Abstract:	Peer Reviewed
Subject(s):	-Àrees temàtiques de la UPC::Enginyeria química::Biotecnologia -Àrees temàtiques de la UPC::Enginyeria electrònica -Atomic force microscopy -Molecular biology -Modulation (Electronics) -Amplitude modulation Atomic force microscopy -Microscòpia de força atòmica -Biologia molecular -Modulació (Electrònica)
Rights:
Document type:	Article - Published version Article
Share:

Show full item record