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Experimental investigations into the effects of electrical stress on electromagnetic emission from integrated circuits
Boyer, Alexandre; Dhia, Sonia Ben; Fernández García, Raúl; Berbel Artal, Néstor
Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. TIEG - Grup d'Electrònica Industrial Terrassa
Recent studies have shown that the aging of integrated circuits may modify electromagnetic emission significantly. This paper reports on an experiment to elucidate the origins of emis- sion level changes in a test chip using 90-nm CMOS technology. Circuit analysis, combined with electromagnetic emission and on- chip power supply voltage bounce measurements made during the application of electric stress, have identified the role of intrinsic wear-out mechanisms, which contribute to a progressive change in the transient current produced by the circuit.
Peer Reviewed
Electronic circuits
Aging effects
electromagnetic emission
integrated circuits
semiconductor device reliability
Circuits integrats

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