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Experimental investigations into the effects of electrical stress on electromagnetic emission from integrated circuits
Boyer, Alexandre; Dhia, Sonia Ben; Fernández García, Raúl; Berbel Artal, Néstor
Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. TIEG - Grup d'Electrònica Industrial Terrassa
Semiconductors
Electronic circuits
Aging effects
electromagnetic emission
integrated circuits
semiconductor device reliability
Semiconductors
Electromagnetisme
Circuits integrats
Electromagnetism
info:eu-repo/semantics/publishedVersion
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