Impact of gate tunnelling leakage on CMOS circuits with full open defects

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To access the full text documents, please follow this link: http://hdl.handle.net/2117/20118

dc.contributor	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.contributor	Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat
dc.contributor.author	Rodríguez Montañés, Rosa
dc.contributor.author	Arumi Delgado, Daniel
dc.contributor.author	Figueras Pàmies, Joan
dc.contributor.author	Eichenberger, S.
dc.contributor.author	Hora, Camelia
dc.contributor.author	Kruseman, B.
dc.date	2007-10
dc.identifier.citation	Rodriguez, R. [et al.]. Impact of gate tunnelling leakage on CMOS circuits with full open defects. "Electronics Letters", Octubre 2007, vol. 43, núm. Issue 21, p. 1140-1141.
dc.identifier.citation	0013-5194
dc.identifier.citation	10.1049/el:20072117
dc.identifier.uri	http://hdl.handle.net/2117/20118
dc.language.iso	eng
dc.publisher	Institution of Electrical Engineers
dc.relation	http://ieeexplore.ieee.org/search/srchabstract.jsp?arnumber=4349252&isnumber=4349241&punumber=2220&k2dockey=4349252@ieejrns&query=%28%28arume%29%3Cin%3Emetadata+%29&pos=0
dc.rights	info:eu-repo/semantics/openAccess
dc.subject	Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats
dc.subject	Metal oxide semiconductors, Complementary
dc.subject	CMOS integrated circuits
dc.subject	Circuits integrats -- CMOS -- Disseny i construcció
dc.title	Impact of gate tunnelling leakage on CMOS circuits with full open defects
dc.type	info:eu-repo/semantics/publishedVersion
dc.type	info:eu-repo/semantics/article
dc.description.abstract	Electronics Letter of the Month
dc.description.abstract	Interconnecting lines with full open defects become floating lines. In nanometric CMOS technologies, gate tunnelling leakage currents impact the behaviour of these lines, which cannot be considered electrically isolated anymore. The voltage of the floating node is determined by its neighbours and leakage currents. After some time an equilibrium is reached between these effects. Theoretical analysis and experimental evidence of this behaviour are presented.
dc.description.abstract	Peer Reviewed
dc.description.abstract	Award-winning

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