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On the use of static temperature measurements as process variation observable
Gómez, Didac; Altet Sanahujes, Josep; Mateo Peña, Diego
Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
In this paper we present the use of static temperature measurements as process variation observable. Contrary to previously published thermal testing methods, the proposed methodology does not need an excitation signal, thus reducing test cost and improving built-in capabilities of thermal monitoring. The feasibility of the technique and a complete test methodology is presented using a narrowband LNA as example. Finally, a complete electro-thermal co-simulation test bench between the LNA and a differential temperature sensor embedded in the same silicon die is presented in order to validate the results. Results prove that RF figures of merit can be extracted from DC temperature measurements done without loading or exciting the RF circuit under test.
Peer Reviewed
Àrees temàtiques de la UPC::Enginyeria agroalimentària::Ciències de la terra i de la vida::Climatologia i meteorologia
Temperature measurements
CMOS process variation
Design for manufacturability
RF built-in test
RF thermal testing
Thermal monitoring
Termometria
Attribution-NonCommercial-NoDerivs 3.0 Spain
http://creativecommons.org/licenses/by-nc-nd/3.0/es/
info:eu-repo/semantics/publishedVersion
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