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Title: | On the use of static temperature measurements as process variation observable |
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Author: | Gómez, Didac; Altet Sanahujes, Josep; Mateo Peña, Diego |
Other authors: | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
Abstract: | In this paper we present the use of static temperature measurements as process variation observable. Contrary to previously published thermal testing methods, the proposed methodology does not need an excitation signal, thus reducing test cost and improving built-in capabilities of thermal monitoring. The feasibility of the technique and a complete test methodology is presented using a narrowband LNA as example. Finally, a complete electro-thermal co-simulation test bench between the LNA and a differential temperature sensor embedded in the same silicon die is presented in order to validate the results. Results prove that RF figures of merit can be extracted from DC temperature measurements done without loading or exciting the RF circuit under test. |
Abstract: | Peer Reviewed |
Subject(s): | -Àrees temàtiques de la UPC::Enginyeria agroalimentària::Ciències de la terra i de la vida::Climatologia i meteorologia -Temperature measurements -CMOS process variation -Design for manufacturability -RF built-in test -RF thermal testing -Thermal monitoring -Termometria |
Rights: | Attribution-NonCommercial-NoDerivs 3.0 Spain
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
Document type: | Article - Published version Article |
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