Título:
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Large-system analysis of a CDMA dynamic channel under a Markovian input process
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Autor/a:
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Biglieri, Ezio; Grossi, Emanuele; Lops, Marco; Tauste Campo, Adrià
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Otros autores:
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Universitat Pompeu Fabra |
Abstract:
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Comunicació presentada al IEEE International Symposium on Information Theory (ISIT '08), celebrat a Toronto (Ontario, Canadà) els dies 6, 7, 8, 9, 10 i 11 de juliol de 2008, organitzat per l'Institute of Electrical and Electronics Engineers (IEEE). |
Abstract:
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We study the minimum mean square error (MMSE) and the multiuser efficiency η of large dynamic multiple access communication systems in which optimal multiuser detection is performed at the receiver as the number and the identities of active users is allowed to change at each transmission time. The system dynamics are ruled by a Markov model describing the evolution of the channel occupancy and a large-system analysis is performed when the number of observations grow large. Starting on the equivalent scalar channel and the fixed-point equation tying multiuser efficiency and MMSE, we extend it to the case of a dynamic channel, and derive lower and upper bounds for the MMSE (and, thus, for η as well) holding true in the limit of large signal–to–noise ratios and increasingly large observation time T. |
Abstract:
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This work was supported by the Spanish Ministry of Education and Science/nunder Project TEC2006- 01428/TCM, and by the STREP project No. IST-/n026905 (MASCOT) within the 6th framework program of the European/nCommission. |
Materia(s):
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-Comunicacions mòbils, Sistemes de -Processos de Markov -Accés múltiple per divisió de codi |
Derechos:
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© 2008 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works./nThe final published article can be found at http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=4595297 |
Tipo de documento:
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Objeto de conferencia Artículo - Versión publicada |
Editor:
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Institute of Electrical and Electronics Engineers (IEEE)
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