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Limit to the erbium ions emission in silicon-rich oxide films by erbium ion clustering
Prtljaga, Nikola; Navarro Urrios, Daniel; Tengattini, Andrea; Anopchenko, Aleksei; Ramirez Ramírez, Joan Manel; Rebled, J. M. (José Manuel); Estradé Albiol, Sònia; Colonna, Jean-Philippe; Fedeli, Jean-Marc; Garrido Fernández, Blas; Pavesi, Lorenzo
Universitat de Barcelona
Ciència dels materials
Òptica
Materials science
Optics
(c) The Optical Society (OSA), 2012
Article
The Optical Society
         

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