To access the full text documents, please follow this link: http://hdl.handle.net/2445/32220
dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Pérez Rodríguez, Alejandro |
dc.contributor.author | Cornet i Calveras, Albert |
dc.contributor.author | Morante i Lleonart, Joan Ramon |
dc.contributor.author | Jiménez, J. |
dc.contributor.author | Hemment, Peter L. F. |
dc.contributor.author | Homewood, K. P. |
dc.date | 2012-10-08T12:49:00Z |
dc.date | 2012-10-08T12:49:00Z |
dc.date | 1991 |
dc.date | 2012-10-08T12:49:00Z |
dc.identifier.citation | 0021-8979 |
dc.identifier.citation | 061605 |
dc.identifier.uri | http://hdl.handle.net/2445/32220 |
dc.format | 6 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | American Institute of Physics |
dc.relation | Reproducció del document publicat a: http://dx.doi.org/10.1063/1.349536 |
dc.relation | Journal of Applied Physics, 1991, vol. 70, num. 3, p. 1678-1683 |
dc.relation | http://dx.doi.org/10.1063/1.349536 |
dc.rights | (c) American Institute of Physics , 1991 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Pel·lícules fines |
dc.subject | Estructura electrònica |
dc.subject | Nanoestructures |
dc.subject | Thin films |
dc.subject | Electronic structure |
dc.subject | Nanostructures |
dc.title | Raman scattering and photoluminescence analysis of silicon on insulator structures obtained by single and multiple oxygen implants |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.description.abstract |