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RECERCAT Home > Universitat de Barcelona > Enginyeria Electrònica i Biomèdica > Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) > View document

To access the full text documents, please follow this link: http://hdl.handle.net/2445/32219

dc.contributor Universitat de Barcelona
dc.contributor.author Peiró Martínez, Francisca
dc.contributor.author Cornet i Calveras, Albert
dc.contributor.author Morante i Lleonart, Joan Ramon
dc.contributor.author Clark, S. A.
dc.contributor.author Williams, R. H.
dc.date 2012-10-08T12:08:11Z
dc.date 2012-10-08T12:08:11Z
dc.date 1992
dc.date 2012-10-08T12:08:11Z
dc.identifier.citation 0021-8979
dc.identifier.citation 061619
dc.identifier.uri http://hdl.handle.net/2445/32219
dc.format 3 p.
dc.format application/pdf
dc.language.iso eng
dc.publisher American Institute of Physics
dc.relation Reproducció del document publicat a: http://dx.doi.org/10.1063/1.351083
dc.relation Journal of Applied Physics, 1992, vol. 71, num. 5, p. 2470-2472
dc.relation http://dx.doi.org/10.1063/1.351083
dc.rights (c) American Institute of Physics , 1992
dc.rights info:eu-repo/semantics/openAccess
dc.subject Microscòpia electrònica
dc.subject Pel·lícules fines
dc.subject Feixos moleculars
dc.subject Electron microscopy
dc.subject Thin films
dc.subject Molecular beams
dc.title Alloy inhomogeneities in InAlAs strained layers grown by MBE
dc.type info:eu-repo/semantics/article
dc.type info:eu-repo/semantics/publishedVersion
dc.description.abstract

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Fine speckle contrast in InGaAs/InP systems: Influence of layer thickness, missmatch, and growing temperature
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Analysis by optical absorption and transmission electron microscopy of the strain inhomogeneities in InGaAs/InP strained layers
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Vilà i Arbonès, Anna Maria; Peiró Martínez, Francisca; Cornet i Calveras, Albert; Morante i Lleonart, Joan Ramon
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