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dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Peiró Martínez, Francisca |
dc.contributor.author | Cornet i Calveras, Albert |
dc.contributor.author | Herms Berenguer, Atilà |
dc.contributor.author | Morante i Lleonart, Joan Ramon |
dc.contributor.author | Clark, S. A. |
dc.contributor.author | Williams, R. H. |
dc.date | 2012-10-08T12:58:36Z |
dc.date | 2012-10-08T12:58:36Z |
dc.date | 1993 |
dc.date | 2012-10-08T12:58:36Z |
dc.identifier.citation | 0021-8979 |
dc.identifier.citation | 071215 |
dc.identifier.uri | http://hdl.handle.net/2445/32222 |
dc.format | 5 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | American Institute of Physics |
dc.relation | Reproducció del document publicat a: http://dx.doi.org/10.1063/1.352815 |
dc.relation | Journal of Applied Physics, 1993, vol. 73, num. 9, p. 4319-4323 |
dc.relation | http://dx.doi.org/10.1063/1.352815 |
dc.rights | (c) American Institute of Physics , 1993 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Pel·lícules fines |
dc.subject | Feixos moleculars |
dc.subject | Nanotecnologia |
dc.subject | Thin films |
dc.subject | Molecular beams |
dc.subject | Nanotechnology |
dc.title | Fine speckle contrast in InGaAs/InP systems: Influence of layer thickness, missmatch, and growing temperature |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.description.abstract |