Recommended citation for this document

Jambois, Olivier ; Berencén Ramírez, Yonder Antonio ; Hijazi, K. ; Wojdak, M. ; Kenyon, Anthony J. ; Gourbilleau, F. ; Rizk, Richard ; Garrido Fernández, Blas. "Current transport and electroluminescence mechanisms in thin SiO2 films containing Si nanocluster-sensitized erbium ions.". Universitat de Barcelona. . <http://hdl.handle.net/2445/32209>. [Consulta: 22-12-14].