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dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Sancho i Parramon, Jordi |
dc.contributor.author | Ferré Borrull, Josep |
dc.contributor.author | Bosch i Puig, Salvador |
dc.contributor.author | Ferrara, Maria Christina |
dc.date | 2012-04-20T12:10:15Z |
dc.date | 2012-04-20T12:10:15Z |
dc.date | 2003 |
dc.identifier.citation | 0003-6935 |
dc.identifier.citation | 505505 |
dc.identifier.uri | http://hdl.handle.net/2445/24296 |
dc.format | 5 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | Optical Society of America |
dc.relation | Reproducció del document publicat a: http://dx.doi.org/10.1364/AO.42.001325 |
dc.relation | Applied Optics, 2004, vol. 42, núm. 7, p. 1325-1329 |
dc.relation | http://dx.doi.org/10.1364/AO.42.001325 |
dc.rights | (c) Optical Society of America, 2003 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Òptica electrònica |
dc.subject | Electron optics |
dc.title | Use of information on the manufacture of samples for the optical characterization of multilayers through a global optimization |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.description.abstract |