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RECERCAT Home > Universitat de Barcelona > Física Aplicada > Articles publicats en revistes (Física Aplicada) > View document

To access the full text documents, please follow this link: http://hdl.handle.net/2445/24307

dc.contributor Universitat de Barcelona
dc.contributor.author Ferré Borrull, Josep
dc.contributor.author Duparré, Angela
dc.contributor.author Quesnel, Etienne
dc.date 2012-04-23T07:03:47Z
dc.date 2012-04-23T07:03:47Z
dc.date 2000
dc.identifier.citation 0003-6935
dc.identifier.citation 194020
dc.identifier.uri http://hdl.handle.net/2445/24307
dc.format 11 p.
dc.format application/pdf
dc.language.iso eng
dc.publisher Optical Society of America
dc.relation Reproducció del document publicat a: http://dx.doi.org/10.1364/AO.39.005854
dc.relation Applied Optics, 2000, Vol. 39, Issue 31, pp. 5854-5864
dc.relation http://dx.doi.org/10.1364/AO.39.005854
dc.rights (c) Optical Society of America, 2000
dc.rights info:eu-repo/semantics/openAccess
dc.subject Dispersió de la llum
dc.subject Òptica electrònica
dc.subject Light scattering
dc.subject Electron optics
dc.title Roughness and light scattering of ion-beam-sputtered fluoride coatings for 193 nm
dc.type info:eu-repo/semantics/article
dc.type info:eu-repo/semantics/publishedVersion
dc.description.abstract

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Use of information on the manufacture of samples for the optical characterization of multilayers through a global optimization
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