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dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Bosch i Puig, Salvador |
dc.contributor.author | Pérez Tudela, Julio D. |
dc.contributor.author | Canillas i Biosca, Adolf |
dc.date | 2012-04-17T07:09:02Z |
dc.date | 2012-04-17T07:09:02Z |
dc.date | 1998 |
dc.identifier.citation | 0003-6935 |
dc.identifier.citation | 127061 |
dc.identifier.uri | http://hdl.handle.net/2445/23863 |
dc.format | 3 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | Optical Society of America |
dc.relation | http://dx.doi.org/10.1364/AO.37.001177 |
dc.relation | Applied Optics, 1998, vol. 37, p. 1177-1179 |
dc.relation | http://dx.doi.org/10.1364/AO.37.001177 |
dc.rights | (c) Optical Society of America, 1998 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | El·lipsometria |
dc.subject | Anàlisi numèrica |
dc.subject | Ellipsometry |
dc.subject | Numerical analysis |
dc.title | Numerical algorithm for spectroscopic ellipsometry of thick transparent films |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.description.abstract |