Production and characterization of clinker thin fi lms as a new tool for nanoscale studies of hydration mechanisms

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dc.contributor	Universitat Politècnica de Catalunya. Departament d'Enginyeria de la Construcció
dc.contributor	Universitat Politècnica de Catalunya. Departament de Física i Enginyeria Nuclear
dc.contributor	Universitat Politècnica de Catalunya. GCM - Grup de Caracterització de Materials
dc.contributor.author	Rheinheimer, Vanessa
dc.contributor.author	Veglio, Néstor Raúl
dc.contributor.author	Casanova Hormaechea, Ignasi
dc.date	2011
dc.identifier.citation	Rheinheimer, V.; Veglio, N.; Casanova, I. Production and characterization of clinker thin fi lms as a new tool for nanoscale studies of hydration mechanisms. A: International Congress on the Chemistry of Cement. "13th International Congress on the Chemistry of Cement". Madrid: Instituto de Ciencias de la Construcción Eduardo Torroja (ICCET), 2011, p. 231-238.
dc.identifier.citation	84-7292-400-0
dc.identifier.uri	http://hdl.handle.net/2117/13131
dc.language.iso	eng
dc.publisher	Instituto de Ciencias de la Construcción Eduardo Torroja (ICCET)
dc.rights	info:eu-repo/semantics/openAccess
dc.subject	Àrees temàtiques de la UPC::Enginyeria civil::Materials i estructures::Materials i estructures de formigó
dc.subject	Cement composites--Testing
dc.subject	Clinker
dc.subject	thin films
dc.subject	hydration
dc.subject	Ciment pòrtland -- Assaigs de materials
dc.title	Production and characterization of clinker thin fi lms as a new tool for nanoscale studies of hydration mechanisms
dc.type	info:eu-repo/semantics/publishedVersion
dc.type	info:eu-repo/semantics/conferenceObject
dc.description.abstract	Nanometer-sized films of clinker phases have been prepared using electron-beam evaporation methods with the aim to produce suitable samples for nanoscale studies of hydration mechanisms and nanomechanical properties of cementitious materials. After deposition on a silicon substrate, film thicknesses and mineralogical composition were characterized by optical interferometry (OI) and grazing-angle X-ray diffraction (GAXRD), respectively. Chemical composition of samples was determined by X-ray photoelectron spectroscopy (XPS) of samples of a few tens of nanometers in thickness. Results from the GAXRD and XPS analysis show that samples quickly react with the atmosphere and show clear signatures of partial hydration and carbonation. However, quantitative analysis shows that the Ca:Si ratio of the deposited film is the same as in the bulk starting material.

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