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| dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
|---|---|
| dc.contributor | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
| dc.contributor.author | Vatajelu, Elena Ioana |
| dc.contributor.author | Renovell, Michel |
| dc.contributor.author | Figueras Pàmies, Joan |
| dc.date | 2010 |
| dc.identifier.citation | Vatajelu, E.; Renovell, M.; Figueras, J. Robustness of SRAM to Power Supply Noise during Leakage Power Saving in DVS. A: International Workshop on the Impact of Low Power design on Test and Reliability(LPonTR). "LPonTR'10 - International Workshop on the Impact of Low Power design on Test and Reliability". Praga: IEEE Press. Institute of Electrical and Electronics Engineers, 2010, p. 1-3. |
| dc.identifier.uri | http://hdl.handle.net/2117/11964 |
| dc.language.iso | eng |
| dc.publisher | IEEE Press. Institute of Electrical and Electronics Engineers |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
| dc.rights | info:eu-repo/semantics/openAccess |
| dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
| dc.subject | Electronic engineering |
| dc.subject | Enginyeria electrònica -- Congressos |
| dc.title | Robustness of SRAM to Power Supply Noise during Leakage Power Saving in DVS |
| dc.type | info:eu-repo/semantics/submittedVersion |
| dc.type | info:eu-repo/semantics/conferenceObject |
| dc.description.abstract |
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