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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat |
dc.contributor.author | Vatajelu, Elena Ioana |
dc.contributor.author | Figueras Pàmies, Joan |
dc.date | 2010 |
dc.identifier.citation | Vatajelu, E.; Figueras, J. Statistical analysis of SRAM aarametric failure under supply voltage scaling. A: IEEE-TTTC International Conference on Automation, Quality and Testing, Robotics. "IEEE Automation, Quality and Testing, Robotics - AQTR 2010, Cl". Cluj Napoca: IEEE Computer Society Publications, 2010, p. 1-6. |
dc.identifier.citation | 10.1109/AQTR.2010.5520825 |
dc.identifier.uri | http://hdl.handle.net/2117/11965 |
dc.language.iso | eng |
dc.publisher | IEEE Computer Society Publications |
dc.relation | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5520825 |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights | info:eu-repo/semantics/openAccess |
dc.rights | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject | Electronic engineering |
dc.subject | Enginyeria electrònica |
dc.title | Statistical analysis of SRAM aarametric failure under supply voltage scaling |
dc.type | info:eu-repo/semantics/submittedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract |