Parametric   Failure Analysis of Embedded SRAMs using Fast & Accurate Dynamic  Analysis

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dc.contributor	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.contributor	Universitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat
dc.contributor.author	Vatajelu, Elena Ioana
dc.contributor.author	Panagopoulos, Georgios
dc.contributor.author	Roy, Kaushik
dc.contributor.author	Figueras Pàmies, Joan
dc.date	2010
dc.identifier.citation	Vatajelu, E. [et al.]. Parametric Failure Analysis of Embedded SRAMs using Fast & Accurate Dynamic Analysis. A: IEEE European Test Symposium. "15th IEEE European Test Symposium". Praga: IEEE Press. Institute of Electrical and Electronics Engineers, 2010, p. 69-74.
dc.identifier.citation	978-1-4244-5833-2
dc.identifier.citation	CFP10216-USB
dc.identifier.uri	http://hdl.handle.net/2117/11966
dc.language.iso	eng
dc.publisher	IEEE Press. Institute of Electrical and Electronics Engineers
dc.relation	http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5512778
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights	info:eu-repo/semantics/openAccess
dc.rights	http://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subject	Àrees temàtiques de la UPC::Enginyeria electrònica
dc.subject	Electronic engineering
dc.subject	Enginyeria electrònica -- Congressos
dc.title	Parametric Failure Analysis of Embedded SRAMs using Fast & Accurate Dynamic Analysis
dc.type	info:eu-repo/semantics/submittedVersion
dc.type	info:eu-repo/semantics/conferenceObject
dc.description.abstract	Peer Reviewed