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Propagation of measurement noise through backprojection reconstruction in electrical impedance tomography
Frangi Caregnato, Alejandro; Riu Costa, Pere Joan; Rosell Ferrer, Francisco Javier; Viergever, Max A.
Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica
A framework to analyze the propagation of measurement noise through backprojection reconstruction algorithms in electrical impedance tomography (EIT) is presented. Two measurement noise sources were considered: noise in the current drivers and in the voltage detectors. The influence of the acquisition system architecture (serial/semi-parallel) is also discussed. Three variants of backprojection reconstruction are studied: basic (unweighted), weighted and exponential backprojection. The results of error propagation theory have been compared with those obtained from simulated and experimental data. This comparison shows that the approach provides a good estimate of the reconstruction error variance. It is argued that the reconstruction error in EIT images obtained via backprojection can be approximately modeled as a spatially nonstationary Gaussian distribution. This methodology allows us to develop a spatial characterization of the reconstruction error in EIT images.
Peer Reviewed
Àrees temàtiques de la UPC::Enginyeria biomèdica::Electrònica biomèdica
Electrodiagnosis
Computer vision
Electric impedance imaging
Gaussian distribution
Image reconstruction
Measurement errors
Medical image processing
Backprojection reconstruction
Medical diagnostic imaging
Electrical impedance tomography
Error propagation theory
Reconstruction error characterization
Spatial characterization
Current drivers
Voltage detectors
Acquisition system architecture
Spatially nonstationary Gaussian distribution
Electrodiagnòstic
Visió per ordinador en medicina
Article
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
         

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