To access the full text documents, please follow this link: http://hdl.handle.net/2117/10718

Thermal coupling in ICs: aplications to the test and characterization of analogue and RF circuits
Altet Sanahujes, Josep; Mateo Peña, Diego; Aldrete Vidrio, Héctor
Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grupo de Circuitos y Sistemas Integrados de Altas Prestaciones
In this presentation we cover how to use low frequency or DC temperature measurements to observe figures of merit of high frequency analogue circuits.
Àrees temàtiques de la UPC::Enginyeria electrònica
Low frequency
Electric circuits
Radio frequency
Electronic engineering
Electrònica
Circuits
info:eu-repo/semantics/publishedVersion
info:eu-repo/semantics/conferenceObject
         

Show full item record

Related documents

Other documents of the same author

Aldrete Vidrio, Héctor; Onabajo, M.; Altet Sanahujes, Josep; Mateo Peña, Diego; Silva-Martínez, José
Altet Sanahujes, Josep; Aldrete Vidrio, Héctor; Reverter Cubarsí, Ferran; Gómez Salinas, Dídac; Gonzalez Jimenez, J. L.; Onabajo, Marvin; Silva Martinez, Jose; Martineau, B.; Perpiñà Gilabet, Xavier; Abdallah, Louay; Stratigopoulos, Haralampos-G.; Aragonès Cervera, Xavier; Jordà, Xavier; Vellvehi, Miquel; Dilhaire, Stefan; Mir, Salvador; Mateo Peña, Diego
Rubio Sola, Jose Antonio; Altet Sanahujes, Josep; Mateo Peña, Diego
Onabajo, M.; Gómez Salinas, Dídac; Aldrete Vidrio, Eduardo; Altet Sanahujes, Josep; Mateo Peña, Diego; Silva-Martínez, José
González Jiménez, José Luis; Martineau, Baudouin; Mateo Peña, Diego; Altet Sanahujes, Josep
 

Coordination

 

Supporters