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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | Altet Sanahujes, Josep |
dc.contributor.author | Gómez Salinas, Dídac |
dc.contributor.author | Dufis, Cédric Yvan |
dc.contributor.author | González Jiménez, José Luis |
dc.contributor.author | Mateo Peña, Diego |
dc.contributor.author | Aragonès Cervera, Xavier |
dc.contributor.author | Moll Echeto, Francisco de Borja |
dc.contributor.author | Rubio Sola, Jose Antonio |
dc.date | 2010-05-26 |
dc.identifier.citation | Altet, J. [et al.]. On evaluating temperature as observable for CMOS technology variability. A: European workshop on CMOS Variability. "1st IEEE European Workshop on CMOS Variability". Montpellier: 2010, p. 1-6. |
dc.identifier.uri | http://hdl.handle.net/2117/11126 |
dc.language.iso | eng |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria de la telecomunicació |
dc.subject | Metal oxide semiconductors, Complementary |
dc.subject | Signal theory (Telecommunication) |
dc.subject | Electromotive force |
dc.subject | Radio frequency microelectromechanical systems |
dc.subject | Senyal, Teoria del (Telecomunicació) |
dc.title | On evaluating temperature as observable for CMOS technology variability |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract |