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dc.contributor | Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions |
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dc.contributor | Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
dc.contributor.author | Lázaro Guillén, Antoni |
dc.contributor.author | Pradell i Cara, Lluís |
dc.contributor.author | O'Callaghan Castellà, Juan Manuel |
dc.date | 1999 |
dc.identifier.citation | Lazaro, A.; Pradell, L.; O'Callaghan, J.M. FET noise-parameter determination using a novel technique based on 50-Ω noise-figure measurements. IEEE Transactions on microwave theory and techniques, 1999, vol.47, issue 3, p. 315-324 |
dc.identifier.citation | 0018-9480 |
dc.identifier.uri | http://hdl.handle.net/2117/671 |
dc.language.iso | eng |
dc.publisher | IEEE |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques |
dc.subject | Microwave measurements |
dc.subject | calibration |
dc.subject | electric noise measurement |
dc.subject | equivalent circuits |
dc.subject | microwave field effect transistors |
dc.subject | microwave measurement |
dc.subject | semiconductor device measurement |
dc.subject | semiconductor device models |
dc.subject | semiconductor device noise |
dc.subject | Microones -- Dispositius |
dc.title | Fet noise-parameter determination using a novel technique based on 50 noise measurements |
dc.type | info:eu-repo/semantics/article |
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