Mechanisms for conduction via low-frequency noise measurements of High-Tc Thin-film microbridges

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dc.contributor	Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions
dc.contributor	Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
dc.contributor.author	Nguyen, T. D.
dc.contributor.author	O'Callaghan Castellà, Juan Manuel
dc.contributor.author	Davidson, B. A.
dc.contributor.author	Redwing, R. D.
dc.contributor.author	Hohenwarter, G. K. G.
dc.contributor.author	Nordman, J. E.
dc.contributor.author	Beyer, J. B.
dc.date	1994
dc.identifier.citation	Nguyen, T.; O'Callaghan, J. M.; Davidson, B. A.; Redwing, R. D.; Hohenwarter, G. K. G.; Nordman, J. E.; Beyer, J. B.; Mechanisms for conduction via low-frequency noise measurements of high-Tc/sub c/thin film microbridges. IEEE Transactions on applied superconductivity, 1995, vol. 5, núm. 2, p. 3369-3372.
dc.identifier.citation	1051-8223
dc.identifier.uri	http://hdl.handle.net/2117/991
dc.language.iso	eng
dc.publisher	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.rights	info:eu-repo/semantics/openAccess
dc.subject	Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques
dc.subject	High temperature superconductors
dc.subject	Superconductivity
dc.subject	1/f noise
dc.subject	barium compounds
dc.subject	flux flow
dc.subject	flux pinning
dc.subject	high-temperature superconductors
dc.subject	superconducting device noise
dc.subject	superconducting device testing
dc.subject	superconducting microbridges
dc.subject	superconducting thin films
dc.subject	yttrium compounds
dc.subject	Superconductors a altes temperatures
dc.subject	Superconductivitat
dc.title	Mechanisms for conduction via low-frequency noise measurements of High-Tc Thin-film microbridges
dc.type	info:eu-repo/semantics/article
dc.description.abstract	We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density S/sub V/(f) is proportional to the DC voltage.
dc.description.abstract	Peer Reviewed

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