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A general approach for the calculation of intermodulation distortion in cavities with superconducting endplates
Mateu Mateu, Jordi; Collado Gómez, Juan Carlos; Menéndez Nadal, Óscar; O'Callaghan Castellà, Juan Manuel
Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
We report on a general procedure to calculate intermodulation distortion in cavities with superconducting endplates that is applicable to the dielectric-loaded cavities currently used for measurement of surface resistance in high-temperature superconductors. The procedure would enable the use such cavities for intermodulation characterization of unpatterned superconducting films, and would remove the uncertainty of measuring intermodulation on patterned devices, in which the effect of patterning damage might influence the outcome of the measurements. We have verified the calculation method by combining superconducting and copper endplates in a rutile-loaded cavity.
Peer Reviewed
Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques
High temperature superconductors
Microwaves
Cavity resonators
superconducting cavity resonators
intermodulation distortion
high-temperature superconductors
surface resistance
superconducting thin films
cavities
superconducting endplates
dielectric-loaded cavities
unpatterned superconducting films
patterned devices
patterning damage
copper endplates
rutile-loaded cavity
microwave nonlinearities
TiO2
Cu
Superconductors a altes temperatures
Microones
Article
AMER INST PHYSICS
         

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