Analysis of dielectric-loaded cavities for characterization of the nonlinear properties of high temperature superconductors

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dc.contributor	Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions
dc.contributor	Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
dc.contributor.author	Mateu Mateu, Jordi
dc.contributor.author	Collado Gómez, Juan Carlos
dc.contributor.author	Menéndez Nadal, Óscar
dc.contributor.author	O'Callaghan Castellà, Juan Manuel
dc.date	2002
dc.identifier.citation	Collado, C.; Mateu, J.; Menendez, O.; O'Callaghan, J. M. Analysis of dielectric-loaded cavities for characterization of the nonlinear properties of high temperature superconductors. IEEE Transactions on applied superconductivity, 2003, vol. 13, núm. 2, p. 332-335.
dc.identifier.citation	1051-8223
dc.identifier.uri	http://hdl.handle.net/2117/1073
dc.language.iso	eng
dc.publisher	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.rights	info:eu-repo/semantics/openAccess
dc.subject	Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques
dc.subject	High temperature superconductors
dc.subject	Superconductivity
dc.subject	high-temperature superconductors
dc.subject	intermodulation distortion
dc.subject	superconducting cavity resonators
dc.subject	superconducting microwave devices
dc.subject	superconducting thin films
dc.subject	Superconductors a altes temperatures
dc.subject	Superconductivitat
dc.title	Analysis of dielectric-loaded cavities for characterization of the nonlinear properties of high temperature superconductors
dc.type	info:eu-repo/semantics/article
dc.description.abstract	This work describes and compares two alternative methods of analyzing dielectric-loaded cavities for measurement of intermodulation distortion in HTS films. One of them is based on assuming a specific type of HTS nonlinearities and developing theoretical equations based on them. The second is based on a numerical approach that can be applied to many types of nonlinearities. Both methods are shown to work on measured data of representative HTS films.
dc.description.abstract	Peer Reviewed

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