|
Title:
|
Extraction of an avalanche diode noise model for its application as on-wafer noise source
|
|
Author:
|
Maya Sánchez, Mª del Carmen; Lázaro Guillén, Antoni; Pradell i Cara, Lluís
|
|
Other authors:
|
Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
|
Abstract:
|
This paper presents a method to characterize the excess noise ratio (ENR) of an unmatched avalanche noise diode for application as an on-wafer noise source. It is based on the determination of a broadband device noise circuit-model from its measured reflection coefficient and noise powers. Measured ENR is used to calibrated a noise receiver up to 40 GHz. |
|
Abstract:
|
Peer Reviewed |
|
Subject(s):
|
-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques
-Electromagnetic noise
-Microwaves
-Diodes, Avalanche
-on-wafer noise source
-excess noise ratio
-small-signal model
-noise temperature measurement
-noise parameters
-avalanche diodes
-electric noise measurement
-electron device noise
-semiconductor device models
-avalanche diode noise model
-unmatched avalanche noise diode
-broadband device noise circuit-model
-reflection coefficient
-noise power
-0 to 40 GHz
-Soroll electromagnètic
-Microones
-Díodes |
|
Rights:
|
|
|
Document type:
|
Article |
|
Published by:
|
JOHN WILEY & SONS INC
|
|
Share:
|
|
