Noise generation and coupling mechanisms in deep-submicron IC's

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To access the full text documents, please follow this link: http://hdl.handle.net/2117/9453

dc.contributor	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.contributor	Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
dc.contributor.author	Aragonès Cervera, Xavier
dc.contributor.author	González Jiménez, José Luis
dc.contributor.author	Moll Echeto, Francisco de Borja
dc.contributor.author	Rubio Sola, Jose Antonio
dc.date	2002-09
dc.identifier.citation	Aragones, X. [et al.]. Noise generation and coupling mechanisms in deep-submicron IC's. "IEEE design and test of computers", Setembre 2002, vol. 19, núm. 5, p. 27-35.
dc.identifier.citation	0740-7475
dc.identifier.citation	10.1109/MDT.2002.1033789
dc.identifier.uri	http://hdl.handle.net/2117/9453
dc.language.iso	eng
dc.relation	http://ieeexplore.ieee.org/search/srchabstract.jsp?arnumber=1033789&isnumber=22200&punumber=54&k2dockey=1033789@ieeejrns&query=%28%28noise+generation+and+coupling+%29%3Cin%3Emetadata%29&pos=4&access=no
dc.rights	info:eu-repo/semantics/openAccess
dc.subject	Àrees temàtiques de la UPC::Enginyeria electrònica
dc.subject	NMOS Microcomputer Systems Applications
dc.subject	Noise generators (Electronics)
dc.subject	Electronics
dc.subject	Electrònica
dc.title	Noise generation and coupling mechanisms in deep-submicron IC's
dc.type	info:eu-repo/semantics/publishedVersion
dc.type	info:eu-repo/semantics/article
dc.description.abstract	On-chip noise generation and coupling is an important issue in deep-submicron technologies. Advanced IC technology faces new challenges to ensure function and performance integrity. Selecting adequate test techniques depends on the circuit, its implementation, and the possible physical failures and parasitic coupling models. This new demand for test technology practices precipitated the investigation of dI/dt and dV/dt noise generation and propagation mechanisms.

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