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Título:
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Comparison of air gap breakdown and substrate injection as mechanisms to induce dielectric charching in microelectromechanical switches
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Autor/a:
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Molinero Giles, David; Castañer Muñoz, Luis María
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Otros autores:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies |
Abstract:
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Experiments show that air breakdown and substrate carrier conduction can be responsible of the
dielectric charging of microelectromechanical devices after electrical stress. Test conducted under
vacuum allows us to isolate the two mechanisms. It is also shown that the relative importance of the
two mechanisms depends on the dielectric nature and technology. |
Abstract:
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Peer Reviewed |
Materia(s):
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-Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica -Microelectromechanical systems. -Breakdown (Electricity) -Air gap breakdown -Dielectric charging -Dielectric layer -Dielectric thin films -Electric breakdown -Electrical stress -Microelectromechanical switches -Reliability -Substrate carrier conduction -Substrate injection -MEMS -Sistemes microelectromecànics |
Derechos:
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Tipo de documento:
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Artículo |
Editor:
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American Institute of Physics
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