To access the full text documents, please follow this link:

Comparison of air gap breakdown and substrate injection as mechanisms to induce dielectric charching in microelectromechanical switches
Molinero Giles, David; Castañer Muñoz, Luis María
Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies
Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica
Microelectromechanical systems.
Breakdown (Electricity)
Air gap breakdown
Dielectric charging
Dielectric layer
Dielectric thin films
Electric breakdown
Electrical stress
Microelectromechanical switches
Substrate carrier conduction
Substrate injection
Sistemes microelectromecànics
American Institute of Physics

Show full item record

Related documents

Other documents of the same author

Molinero Giles, David; Comulada Simpson, Ricard; Castañer Muñoz, Luis María
Blokhina, Elena; Gorreta, Sergi; Lopez, David; Molinero Giles, David; Feely, Orla; Pons Nin, Joan; Domínguez Pumar, Manuel
Ahmadi Zeidabadi, Maziar; Bermejo Broto, Sandra; Castañer Muñoz, Luis María
Coll Valentí, Arnau; Bermejo Broto, Sandra; Castañer Muñoz, Luis María
Ahmadi, Maziar; Bermejo Broto, Sandra; Castañer Muñoz, Luis María