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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. TIEG - Terrassa Industrial Electronics Group |
dc.contributor.author | Li, Binhong |
dc.contributor.author | Berbel Artal, Néstor |
dc.contributor.author | Boyer, A. |
dc.contributor.author | BenDhia, S. |
dc.contributor.author | Fernández García, Raúl |
dc.date | 2011 |
dc.identifier.citation | Li, B. [et al.]. Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences. A: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. "Proceedings European Symposium on Reliability of Electron Devices, Failure Physics and Analysis". 2011. |
dc.identifier.citation | 10.1016/j.microrel.2011.06.010 |
dc.identifier.uri | http://hdl.handle.net/2117/14767 |
dc.language.iso | eng |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Física::Física de l'estat sòlid::Semiconductors |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Components electrònics::Transistors |
dc.subject | Semiconductors |
dc.subject | Metal oxide semiconductors |
dc.subject | Transistors |
dc.subject | Semiconductors |
dc.subject | Metall-òxid-semiconductors |
dc.subject | Transistors |
dc.title | Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences |
dc.type | info:eu-repo/semantics/submittedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
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