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dc.contributor | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
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dc.contributor | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.contributor.author | García Almudéver, Carmen |
dc.contributor.author | Rubio Sola, Jose Antonio |
dc.date | 2011 |
dc.identifier.citation | García, C.; Rubio, J. Manufacturing variability analysis in carbon nanotube technology: a comparison with bulk CMOS in 6T SRAM scenario. A: IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems. "Proceedings IEEE Design and Diagnosis of Electronic Circuits and Systems". Cottbus: 2011, p. 249-254. |
dc.identifier.citation | 978-1-4244-9754-6 |
dc.identifier.citation | 10.1109/DDECS.2011.5783088 |
dc.identifier.uri | http://hdl.handle.net/2117/14490 |
dc.language.iso | eng |
dc.relation | http://ieeexplore.ieee.org/search/srchabstract.jsp?tp=&arnumber=5783088&openedRefinements%3D*%26filter%3DAND%28NOT%284283010803%29%29%26searchField%3DSearch+All%26queryText%3DManufacturing+variability+analysis+in+carbon+nanotube+technology%3A+a+comparison+with+bulk+CMOS+in+6T+SRAM+scenario |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica |
dc.subject | Nanotubes |
dc.subject | Nanotubs |
dc.subject | Nanotubs de carboni |
dc.title | Manufacturing variability analysis in carbon nanotube technology: a comparison with bulk CMOS in 6T SRAM scenario |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.type | info:eu-repo/semantics/conferenceObject |
dc.description.abstract | |
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