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Fault-tolerance capacity of the multilevel active-clamped topology
Nicolás Apruzzese, Joan; Busquets Monge, Sergio; Bordonau Farrerons, José; Alepuz Menéndez, Salvador; Calle Prado, Alejandro
Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. GREP - Grup de Recerca en Electrònica de Potència
Thanks to the inherent redundancy to generate the different output voltage levels, the multilevel active clamped (MAC) topology presents an important fault-tolerance ability which makes it interesting for several applications. This paper presents an analysis of the fault-tolerance capacity of the MAC converter. Both open-circuit and short-circuit faults are considered and the analysis is carried out under single-device and two-simultaneous-device faults. Switching strategies to overcome the limitations caused by faults are proposed. Experimental tests with a four-level MAC prototype are presented to validate the analysis.
Peer Reviewed
Àrees temàtiques de la UPC::Enginyeria electrònica i telecomunicacions::Electrònica de potència
MAC topology
Multilevel converters
Topologia MAC
info:eu-repo/semantics/publishedVersion
info:eu-repo/semantics/conferenceObject
IEEE Press. Institute of Electrical and Electronics Engineers
         

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