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Nanoscale capacitance microscopy of thin dielectric films
Gomila Lluch, Gabriel; Toset Gilabert, Jorge; Fumagalli, Laura
Universitat de Barcelona
We present an analytical model to interpret nanoscale capacitance microscopy measurements on thin dielectric films. The model displays a logarithmic dependence on the tip-sample distance and on the film thickness-dielectric constant ratio and shows an excellent agreement with finite-element numerical simulations and experimental results on a broad range of values. Based on these results, we discuss the capabilities of nanoscale capacitance microscopy for the quantitative extraction of the dielectric constant and the thickness of thin dielectric films at the nanoscale.
08-05-2012
Dielèctrics
Nanotecnologia
Dielectrics
Nanotechnology
(c) American Institute of Physics, 2008
Artículo
American Institute of Physics
         

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