To access the full text documents, please follow this link: http://hdl.handle.net/2445/24743

Nanometer-scale oxidation of Si(100) surfaces by tapping mode atomic force microscopy
Pérez Murano, Francesc; Abadal, G.; Barniol i Beumala, Núria; Aymerich Humet, Xavier; Servat, J.; Gorostiza Langa, Pablo Ignacio; Sanz Carrasco, Fausto
Universitat de Barcelona
2012-05-02
Microscòpia de força atòmica
Silici
Nanoelectrònica
Detectors
camps elèctrics
Atomic force microscopy
Silicon
Nanoelectronics
Detectors
Electric fields
(c) American Institute of Physics, 1995
Article
American Institute of Physics
         

Show full item record

Related documents

Other documents of the same author

Caro, J.; Fraxedas i Calduch, Jordi; Gorostiza Langa, Pablo Ignacio; Sanz Carrasco, Fausto
Porti i Pujal, Marc; Avidano, M.; Nafría i Maqueda, Montserrat; Aymerich Humet, Xavier; Carreras, Josep; Garrido Fernández, Blas
Martín Martínez, Javier; Diaz, Javier; Rodríguez, Rosana; Nafria, Montse; Aymerich Humet, Xavier; Roca Moreno, Elisenda; Fernández Fernández, Francisco V.; Rubio Sola, Jose Antonio
Hoyo Pérez, Javier; Guaus Guerrero, Ester; Oncins, Gerard; Torrent Burgués, Juan; Sanz Carrasco, Fausto
 

Coordination

 

Supporters