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dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Garrido Fernández, Blas |
dc.contributor.author | Samitier i Martí, Josep |
dc.contributor.author | Bota Ferragut, Sebastián Antonio |
dc.contributor.author | Moreno, J. A. |
dc.contributor.author | Montserrat i Martí, Josep |
dc.contributor.author | Morante i Lleonart, Joan Ramon |
dc.date | 2012-05-02T11:20:04Z |
dc.date | 2012-05-02T11:20:04Z |
dc.date | 1984-12-01 |
dc.date | 2012-04-20T11:12:20Z |
dc.identifier.citation | 0021-8979 |
dc.identifier.citation | 109979 |
dc.identifier.uri | http://hdl.handle.net/2445/24747 |
dc.format | 9 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | American Institute of Physics |
dc.relation | Reproducció del document publicat a: http://dx.doi.org/10.1063/1.363998 |
dc.relation | Journal of Applied Physics, 1997, vol. 81, núm. 1, p. 126-134 |
dc.relation | http://dx.doi.org/10.1063/1.363998 |
dc.rights | (c) American Institute of Physics, 1998 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Implantació d'ions |
dc.subject | Espectroscòpia |
dc.subject | Spectrum analysis |
dc.subject | Ion implantation |
dc.title | Reconstruction of the SiO2 structure damaged by low-energy Ar-implanted ions |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.description.abstract |