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dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Vilà i Arbonès, Anna Maria |
dc.contributor.author | Cornet i Calveras, Albert |
dc.contributor.author | Morante i Lleonart, Joan Ramon |
dc.contributor.author | Ruterana, Pierre |
dc.contributor.author | Loubradou, Marc |
dc.contributor.author | Bonnet, Roland |
dc.date | 2012-05-02T11:13:30Z |
dc.date | 2012-05-02T11:13:30Z |
dc.date | 1996-01-15 |
dc.identifier.citation | 0021-8979 |
dc.identifier.citation | 106453 |
dc.identifier.uri | http://hdl.handle.net/2445/24745 |
dc.format | 6 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | American Institute of Physics |
dc.relation | Reproducció del document publicat a: http://dx.doi.org/10.1063/1.360812 |
dc.relation | Journal of Applied Physics, 1996, vol. 79, núm. 2, p. 676-681 |
dc.relation | http://dx.doi.org/10.1063/1.360812 |
dc.rights | (c) American Institute of Physics, 1996 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Microscòpia electrònica |
dc.subject | Feixos moleculars |
dc.subject | Electron microscopy |
dc.subject | Molecular beams |
dc.title | Structure of 60° dislocations at the GaAs/Si interface |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.description.abstract |