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Characterization of the EL2 center in GaAs by optical admittance spectroscopy
Dueñas Carazo, Salvador; Castán Lanaspa, María Elena; Dios, Agustín de; Bailón Vega, Luis A.; Barbolla Sancho, Juan; Pérez Rodríguez, Alejandro
Universitat de Barcelona
2012-04-30
Espectroscòpia
Òptica
Optics
Spectrum analysis
(c) American Institute of Physics, 1990
Article
American Institute of Physics
         

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