To access the full text documents, please follow this link: http://hdl.handle.net/2445/22090

Quantitative x-ray photoelectron spectroscopy study of Al/AlOx bilayers
Batlle Gelabert, Xavier; Hattink, Bart Jan; Labarta, Amílcar; Åkerman, Johan J.; Escudero, Roberto; Schuller, Ivan K.
Universitat de Barcelona
An x-ray photoelectron spectroscopy (XPS) analysis of Nb/Al wedge bilayers, oxidized by both plasma and natural oxidation, is reported. The main goal is to show that the oxidation state¿i.e., O:(oxidize)Al ratio¿, structure and thickness of the surface oxide layer, as well as the thickness of the metallic Al leftover, as functions of the oxidation procedure, can be quantitatively evaluated from the XPS spectra. This is relevant to the detailed characterization of the insulating barriers in (magnetic) tunnel junctions
2012-03-02
Espectroscòpia de raigs X
Fotoelectrons
Espectroscòpia d'electrons
Materials magnètics
Photoelectrons
Electron spectroscopy
Magnetic materials
X-ray spectroscopy
(c) American Institute of Physics, 2002
Article
American Institute of Physics
         

Show full item record

Related documents

Other documents of the same author

Hattink, Bart Jan; García del Muro y Solans, Montserrat; Konstantinovic, Zorica; Batlle Gelabert, Xavier; Labarta, Amílcar
Hattink, Bart Jan; Labarta, Amílcar; García del Muro y Solans, Montserrat; Batlle Gelabert, Xavier; Sánchez Barrera, Florencio; Varela Fernández, Manuel, 1956-
Hattink, Bart Jan; Labarta, Amílcar; García del Muro y Solans, Montserrat; Batlle Gelabert, Xavier; Sánchez Barrera, Florencio; Varela Fernández, Manuel, 1956-
Hattink, Bart Jan; García del Muro y Solans, Montserrat; Konstantinovic, Zorica; Batlle Gelabert, Xavier; Labarta, Amílcar
Prados, C.; Hattink, Bart Jan; Pina, E.; Batlle Gelabert, Xavier; Labarta, Amílcar; González-Miranda, J. M. (Jesús Manuel); Hernando, Antonio, 1947-
 

Coordination

 

Supporters