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Extension of the impedance field method to the noise analysis of a semiconductor junction: Analytical approach
Gomila Lluch, Gabriel; Bulashenko, Oleg; Rubí Capaceti, José Miguel; Kochelap, V. A.(Viacheslav Aleksandrovich)
Universitat de Barcelona
Semiconductors
Soroll electrònic
Díodes
Transistors
Camps elèctrics
Microelectrònica
Semiconductors
Electronic noise
Diodes
Transistors
Electric fields
Microelectronics
(c) American Institute of Physics, 1998
Article
American Institute of Physics
         

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Gomila Lluch, Gabriel; Bulashenko, Oleg; Rubí Capaceti, José Miguel; Kochelap, V. A.(Viacheslav Aleksandrovich)
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