Para acceder a los documentos con el texto completo, por favor, siga el siguiente enlace: http://hdl.handle.net/2445/22078
dc.contributor | Universitat de Barcelona |
---|---|
dc.contributor.author | Gomila Lluch, Gabriel |
dc.contributor.author | Bulashenko, Oleg |
dc.contributor.author | Rubí Capaceti, José Miguel |
dc.contributor.author | Kochelap, V. A.(Viacheslav Aleksandrovich) |
dc.date | 2012-02-16T08:49:31Z |
dc.date | 2012-02-16T08:49:31Z |
dc.date | 1998 |
dc.identifier.citation | 0021-8979 |
dc.identifier.citation | 143475 |
dc.identifier.uri | http://hdl.handle.net/2445/22078 |
dc.format | 9 p. |
dc.format | application/pdf |
dc.language.iso | eng |
dc.publisher | American Institute of Physics |
dc.relation | Reproducció del document publicat a: http://dx.doi.org/10.1063/1.367023 |
dc.relation | Journal of Applied Physics, 1998, vol. 83, núm. 5, p. 2610-2618 |
dc.relation | http://dx.doi.org/10.1063/1.367023 |
dc.rights | (c) American Institute of Physics, 1998 |
dc.rights | info:eu-repo/semantics/openAccess |
dc.subject | Semiconductors |
dc.subject | Soroll electrònic |
dc.subject | Díodes |
dc.subject | Transistors |
dc.subject | Camps elèctrics |
dc.subject | Microelectrònica |
dc.subject | Semiconductors |
dc.subject | Electronic noise |
dc.subject | Diodes |
dc.subject | Transistors |
dc.subject | Electric fields |
dc.subject | Microelectronics |
dc.title | Extension of the impedance field method to the noise analysis of a semiconductor junction: Analytical approach |
dc.type | info:eu-repo/semantics/article |
dc.type | info:eu-repo/semantics/publishedVersion |
dc.description.abstract |