Comparison of on-wafer calibrations using the concept of reference impedance

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Title:	Comparison of on-wafer calibrations using the concept of reference impedance
Author:	Purroy Martín, Francesc; Pradell i Cara, Lluís
Other authors:	Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
Abstract:	A novel method that allows to compare different calibration techniques has been developed. It is based on determining the reference impedance of a given Network Analyzer calibration from the reflection coefficient measurement of a physical open circuit. The method has been applied to several on-wafer calibrations.
Abstract:	Peer Reviewed
Subject(s):	-Àrees temàtiques de la UPC::Enginyeria de la telecomunicació -Telecommunication -Calibration -Reflection -Impedance measurement -Circuits -Capacitance -Telecommunications -Computer networks -Measurement standards -Error correction -Capacitors -Telecomunicació
Rights:	http://creativecommons.org/licenses/by-nc-nd/3.0/es/
Document type:	Article - Published version Conference Object
Published by:	. MICROWAVE EXHIBITORS AND PUBLISHERS
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