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Title: | Development of self-calibration techniques for on-wafer and fixtured measurements: a novel approach |
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Author: | Pradell i Cara, Lluís; Purroy Martín, Francesc; Cáceres, M. |
Other authors: | Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
Abstract: | |
Abstract: | |
Subject(s): | -Àrees temàtiques de la UPC::Enginyeria de la telecomunicació -Telecommunication -Land mobile radio -Calibration -Microstrip -Transmission line measurements -Semiconductor device measurement -Equations -Transmission line matrix methods -Scattering parameters -Coaxial components -Transmission line theory -Telecomunicació |
Rights: | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
Document type: | Article - Published version Conference Object |
Published by: | . MICROWAVE EXHIBITIONS AND PUBLISHERS |
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