Direct extraction of all four transistor noise parameters from 50 noise figure measurements

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Title:	Direct extraction of all four transistor noise parameters from 50 noise figure measurements
Author:	Lázaro Guillén, Antoni; Pradell i Cara, Lluís; Beltrán, A; O'Callaghan Castellà, Juan Manuel
Other authors:	Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions; Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
Abstract:	A new method for measuring the four noise parameters (NPs) of a transistor is presented. It is based on the determination of its intrinsic noise matrix elements (C, ,INT, C,,7NT, Re(C,,
Abstract:	Peer Reviewed
Subject(s):	-Àrees temàtiques de la UPC::Enginyeria electrònica -Electronics -Electrònica
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Document type:	Article - Published version Article
Published by:	Institution of Electrical Engineers
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