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Analysis and RTL correlation of instruction set simulators for automotive microcontroller robustness verification
Espinosa, Jaime; Hernandez, Carles; Abella, Jaume; de Andres, David; Ruiz, Juan C.
Barcelona Supercomputing Center
-Àrees temàtiques de la UPC::Enginyeria electrònica
-Simulation and Modeling
-Automotive technology
-Automotive engineering
-Benchmark testing
-Robustness
-Electrònica--Automòbils
-Simulació, Mètodes de
Article - Submitted version
Conference Object
Institute of Electrical and Electronics Engineers (IEEE)
         

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