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Title:
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Modeling technique of the conducted emission of integrated circuit under different temperatures
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Author:
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Berbel Artal, Néstor; Fernández García, Raúl; Gil Galí, Ignacio
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. RFEMC - Grup de Radiofreqüència i Compatibilitat Electromagnètica en Xarxes de Comunicacions |
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Abstract:
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In this paper the temperature impact on conducted emissions of ICs up to 3 GHz has been analyzed. The electromagnetic conducted emissions of a commercial IC clock generator have been characterized and modelled from 293 K to 358 K. A temperature parametrized lumped-electrical equivalent model including the PCB and IC behaviour has been developed and validated by means of Feature Selective Validation. The results show that the passive distribution network is slightly affected by the temperature, whereas the IC conducted emission presents a clear temperature variation. |
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Abstract:
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Peer Reviewed |
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Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats
-Integrated circuits
-Heat - Conduction
-ICEM-CE
-integrated circuit
-EMC
-internal activity
-FSV
-conducted emissions
-temperature
-Circuits integrats
-Calor--Conducció |
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Rights:
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Document type:
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Article - Submitted version
Article |
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