Atomic force microscopy: probing the nanoworld

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Title:	Atomic force microscopy: probing the nanoworld
Author:	Oncins Marco, Gerard; Díaz Marcos, Jordi
Other authors:	Universitat de Barcelona
Abstract:	Atomic Force Microscope and related techniques have played a key role in the development of the nanotechnology revolution that is taking place in science. This paper reviews the basic principles behind the technique and its different operation modes and applications, pointing out research worksperformed in the Nanometric Techniques Unit of the CCiTUB in order to exemplify the vast array of capabilities of these instruments.
Abstract:	Podeu consultar el llibre complet a: http://hdl.handle.net/2445/32166
Publication date:	2013-11-07
Subject(s):	-Microscòpia de força atòmica -Nanotecnologia -Anàlisi instrumental -Atomic force microscopy -Nanotechnology -Instrumental analysis
Rights:	(c) Universitat de Barcelona, 2012
Document type:	Book Part
Published by:	Centres Científics i Tecnològics. Universitat de Barcelona
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