Mutual information of IID complex Gaussian signals on block Rayleigh-faded channels

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Title:	Mutual information of IID complex Gaussian signals on block Rayleigh-faded channels
Author:	Rusek, Fredrik; Lozano Solsona, Angel; Jindal, Nihar
Abstract:	We present a method to compute, quickly and efficiently, the mutual information achieved by an IID (independent identically distributed) complex Gaussian signal on a block Rayleigh-faded channel without side information at the receiver. The method accommodates both scalar and MIMO (multiple-input multiple-output) settings. Operationally, this mutual information represents the highest spectral efficiency that can be attained using Gaussian/ncodebooks. Examples are provided that illustrate the loss in spectral efficiency caused by fast fading and how that loss is amplified when multiple transmit antennas are used. These examples are further enriched by comparisons with the channel capacity under perfect channel-state information at the receiver, and with the spectral efficiency attained by pilot-based transmission.
Abstract:	The work of A. Lozano is supported by the Spanish Ministry of Science/nand Innovation (Refs. TEC2009-13000 and CONSOLIDER-INGENIO CSD2008-00010 ”COMONSENS”) and by AGAUR (Catalan Agency for/nAdministration of University and Research Grants).
Subject(s):	-Ràdio -- Antenes -Comunicació sense fil, Sistemes de -Tractament del senyal -Wireless communications -Mutual information -MIMO -Multiantenna -Non-coherent spectral efficiency
Rights:	© 2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works./nThe final published article can be found at http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6121994&tag=1
Document type:	Article Article - Accepted version
Published by:	Institute of Electrical and Electronics Engineers (IEEE)
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