Characterization and modelling of EMI susceptibility in integrated circuits at high frequency

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Título:	Characterization and modelling of EMI susceptibility in integrated circuits at high frequency
Autor/a:	Gil Galí, Ignacio; Fernández García, Raúl
Otros autores:	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. TIEG - Terrassa Industrial Electronics Group
Abstract:	In this paper an alternative method for characterizing and modelling the EMI susceptibility in integrated circuits at frequencies above 1 GHz is presented. The PCB layout design is focused on the optimization of the impedance mismatch losses on the radio frequency interference injection path. The PCB has been tested with several commercial operational amplifiers and the methodology is validated through both electrical transmission line simulations and electromagnetic cosimulations.
Abstract:	Peer Reviewed
Materia(s):	-Àrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència -Amplifiers (Electronics) -Integrated circuits -Amplificadors (Electrònica) -Circuits integrats
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Tipo de documento:	Artículo - Versión presentada Objeto de conferencia
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Gil Galí, Ignacio; Fernández García, Raúl; Pous Solà, Marc; Silva Martínez, Fernando

Gil Galí, Ignacio; Fernández García, Raúl; Tornero García, José Antonio

Berbel Artal, Néstor; Fernández García, Raúl; Gil Galí, Ignacio

Moradi, Bahareh; Fernández García, Raúl; Gil Galí, Ignacio

Moradi, Bahareh; Fernández García, Raúl; Gil Galí, Ignacio

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