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Title:
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Variability and reliability analysis of CNFET in the presence of carbon nanotube density fluctuation
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Author:
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García Almudéver, Carmen; Rubio Sola, Jose Antonio
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Other authors:
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Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
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Abstract:
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Current carbon nanotube (CNT) synthesis processes are not perfect. One of the most critical issue is the presence of
density variations in CNT growth. These variations are due to the lack of precise control of CNT location during the synthesis and the presence of metallic CNTs (m-CNTs). In this work we analyze the impact of CNT density fluctuations on carbon nanotube field
effect transistor (CNFET) performance. A CNFET reliability analysis is also presented because of CNT density variations can
cause a complete failure of CNFET. |
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Abstract:
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Peer Reviewed |
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Subject(s):
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-Àrees temàtiques de la UPC::Enginyeria electrònica::Optoelectrònica
-Nanotubes
-Nanotubs |
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Rights:
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Document type:
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Article - Published version
Conference Object |
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Published by:
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IEEE Press. Institute of Electrical and Electronics Engineers
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