SRAM lifetime improvement by using adaptive proactive reconfiguration

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Título:	SRAM lifetime improvement by using adaptive proactive reconfiguration
Autor/a:	Pouyan, Peyman; Amat Bertran, Esteve; Rubio Sola, Jose Antonio
Otros autores:	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
Abstract:	Modern generations of CMOS technology nodes are facing critical causes of hardware reliability failures, which were not significant in the past. Such vulnerabilities make it essential to investigate new robust design strategies at the Nanoscale circuit system level. In this paper we have introduced an adaptive proactive reconfiguration technique that considers the inherent process variability (variability-aware) and BTI aging, and effectively enlarges the SRAM lifetime.
Abstract:	Peer Reviewed
Materia(s):	-Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats -Integrated circuits -Electrònica -Circuits integrats
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Tipo de documento:	Artículo - Versión publicada Objeto de conferencia
Editor:	IEEE Press. Institute of Electrical and Electronics Engineers
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Pouyan, Peyman; Amat Bertran, Esteve; Rubio Sola, Jose Antonio

Pouyan, Peyman; Amat Bertran, Esteve; Rubio Sola, Jose Antonio

Pouyan, Peyman; Amat Bertran, Esteve; Rubio Sola, Jose Antonio

Pouyan, Peyman; Amat Bertran, Esteve; Rubio Sola, Jose Antonio

Rubio Sola, Jose Antonio; Amat Bertran, Esteve; Pouyan, Peyman

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