Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect

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Title:	Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect
Author:	Perpiñà, Xavier; Altet Sanahujes, Josep; Jordà, Xavier; Vellvehi, Miquel; Mestres, Narcís
Other authors:	Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica; Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
Abstract:	This Letter presents a solution for locating hot spots in active integrated circuits (IC) and devices. This method is based on sensing the phase lag between the power periodically dissipated by a device integrated in an IC (hot spot) and its corresponding thermal gradient into the chip substrate by monitoring the heat-induced refractive index gradient with a laser beam. The experimental results show a high accuracy and prove the suitability of this technique to locate and characterize devices behaving as hot spots in current IC technologies.
Subject(s):	-Àrees temàtiques de la UPC::Enginyeria electrònica -System-on-chip design and technologies -Electronic engineering -Integrated circuits -Metal oxide semiconductor field-effect transistors -Transistors -Electrònica
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Document type:	Article - Published version Article
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